STM and JESDAF respectively. A typical Human Body Model circuit is presented in Figure 1. Figure 1: Typical Human Body Model Circuit. In September , a small group of ESD control and design stakeholders assembled in a Read More». In the EERC Resource Center. A Dash of Maxwell’s. JESDAF. – IEC (C= pF). – MIL method Pulse parameters. HBM. Reference voltage. 2KV 4KV. Peak current. A A.

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To provide better data reproducibility, it is permitted to place a shunt resistance between the pin to be stressed Terminal A and the system ground Terminal B in order to quench the pre-pulse phenomenon and eliminate the voltage rise as long as it does not alter the HBM waveforms as specified in Table 1 in tester qualification, calibration and waveform verification. While most power pins are labeled such that they can be easily recognized as power pins examples: Additionally, all personnel shall receive system operational training and electrical safety training prior to using the equipment.

The high-voltage relays jes22 associated high-voltage circuitry shall be tested by the user of computercontrolled systems per the equipment manufacturer’s instructions system diagnostics.

Jesr22 pin connected to terminal A is to be stressed to jesf22 of these subsets separately. The characteristics of this pre-pulse phenomenon depend on the conditions and the environment of the arcing associated with the HBM discharge, the parasitic capacitances of the tester, as well as the pin impedance of the device under test. Any pin that is connected w114f an internal power bus or a power pin by metal must be treated as a power pin example: Other suggestions for document improvement: When the optional shunt resistance as specified in 3.

ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)

A Zener diode with breakdown voltage between 6 V and 15 V and a rating between? All comments will be collected and dispersed to the appropriate committee s. The waveform measurements during calibration shall be made using the worst-case pin on the highest jess22 count board with a positive mechanical clamp socket. All pins one at time to Gnd3 power pin group 4. This shunt resistance can be placed in the HBM simulator or in the test fixturing system. Follow the procedure in step 3. The probe transformer and cable with a nominal length of a114v meter shall have a 1 GHz bandwidth, a minimum current rating of 12 amperes peak pulse-current capability and a rise time of less than one nanosecond.

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The ends of the wire may be ground to a point where clearance is needed to make contact on fine-pitch socket pins.

Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. The number jewd22 power pins tested on Terminal A may be reduced if the power pin group is connected on a package plane see clause 4. Documents Flashcards Grammar checker. It is not permissible to use a test chip representative of the actual chip or to assign threshold voltages based on data compiled from a design library or via software simulations.

JESD22-A114F

Verify that all parameters meet the limits specified in Table 1 and Figure 2. Any pin that is intended to supply power to another circuit on the same chip must be treated as a power pin. This tester issue was found to divert significant current away from the pins connected to Terminal B, such that the slew-rate of the current at terminal B is lower than seen at Terminal A.

Power pins and Power Pin Groups are defined in 4. Active discrete devices FETs, transistors, etc.

jesdaf | In Compliance Magazine

The tester must meet the requirements of Table 1 and Figure 2 at all voltage levels, except V, using the shorting wire and at the V and V levels with the ? However, if another higher starting voltage level a114r used and the device fails, testing shall be restarted with a fresh device at the next lowest level. As an alternative to this method, it is permitted to partition the pins to be connected to terminal B into two a114 more subsets, such that each of jsed22 pins is a member of at least one subset.

The other pins in the group do not need to be stressed. Added third reference to table: NOTE 6 S2 shall be closed at least 10 milliseconds after the pulse delivery period to ensure the DUT socket is not left in a charged state.

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Due to lack of specifications for this phenomenon, the magnitude of the resulting voltage rise at the stressed pin may vary significantly from tester to tester and can alter the behaviors of some ESD protection circuits.

As an alternative to this method, it is permitted to partition the pins to be connected to terminal B into two or more subsets, such that each of these pins is a member of at least one subset.

However, if a pin intended to supply power to a circuit on another chip but not to any circuit on the same chip, it may be treated as a signal pin. While most power pins are labeled such that they can be easily recognized as power pins examples: I recommend changes to the following: Additionally, all personnel shall receive system operational training and electrical safety training prior to using the equipment.

The actual number of pin combination sets depends on the number of power pin groups. Guard band testing is also permitted.

The pin combination with the waveform closest to the limits jsed22 Table 1 shall be designated for waveform verification. Recalibration is required whenever equipment repairs are made that may affect the waveform and a minimum of every 12 months. In that case, the pin may be tied together with the power pin s connected to the same bus and treated as one pin nesd22 Terminal B connection even though it is labeled a different name.

Additionally, the system diagnostics test as defined in 3. Clause Description of change 4. Power pins and Power Pin Groups are defined in 4.

Testing must be performed using an actual device chip. Any part that passes after exposure to an ESD pulse of V. NOTE 2 Precautions must be taken in tester design to avoid recharge transients and multiple pulses.